Advanced Computing in Electron MicroscopyAdvanced Computing in Electron Microscopy



The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the ...

Author: Earl J. Kirkland

Publisher: Springer Nature

ISBN: 9783030332600

Category:

Page: 354

View: 555

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Advanced Computing in Electron MicroscopyAdvanced Computing in Electron Microscopy



Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition.

Author: Earl J. Kirkland

Publisher: Springer

ISBN: 1441965327

Category:

Page: 289

View: 756

Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Advanced Computing in Electron MicroscopyAdvanced Computing in Electron Microscopy



Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition.

Author: Earl J. Kirkland

Publisher: Springer

ISBN: 1441965343

Category:

Page: 289

View: 787

Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Structure Analysis of Advanced NanomaterialsStructure Analysis of Advanced Nanomaterials



Nanoworld by High-Resolution Electron Microscopy Takeo Oku ... 1.3.12 High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) The image is obtained by detecting ... Advanced Computing in Electron Microscopy.

Author: Takeo Oku

Publisher: Walter de Gruyter GmbH & Co KG

ISBN: 9783110305012

Category:

Page: 178

View: 290

High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.

Introduction to Conventional Transmission Electron MicroscopyIntroduction to Conventional Transmission Electron Microscopy



During that time , the instrument has steadily developed from a microscope that barely matched the resolution of an ... Advanced Computing in Electron Microscopy , by E.J. Kirkland [ Kir98 ] ; Transmission Electron Microscopy and ...

Author: Marc De Graef

Publisher: Cambridge University Press

ISBN: 0521629950

Category:

Page: 718

View: 395

A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

High Resolution Electron MicroscopyHigh Resolution Electron Microscopy



Comments on the computation of electron wave propagation in the slice methods. J. Microsc. ... Interpretation of electron channeling by the dynamical thoery of electron diffraction. ... Advanced computing in electron microscopy. Plenum.

Author: John C. H. Spence

Publisher: OUP Oxford

ISBN: 9780191564611

Category:

Page: 424

View: 248

The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. The book covers the usefulness of seeing atoms in the semiconductor industry, in materials science (where scientists strive to make new lighter,stronger, cheaper materials), and condensed matter physics (for example in the study of the new superconductors). Biologists have recently used the atomic-resolution electron microscope to obtain three-dimensional images of the Ribosome, work which is covered in this book. The books also shows how the ability to see atomic arrangements has helped us understand the properties of matter. This new third edition of the standard text retains the early section of the fundamentals of electron optics, linear imaging theory with partial coherence and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of the arrangement of atoms in thin crystals using a modern electron microscope. The sections on applications of atomic resolution transmission electron microscopy (HREM) have been extensively updated, including descriptions of HREM in the semiconductor industry, superconductor research, solid state chemistry and nanoscience, as well as metallurgy, mineralogy, condensed matter physics, materials science and biology. Entirely new sections have been added on electron holography , aberration correctors, field-emission guns, imaging filters, HREM in biology an don organic crystals,super-resolution methods, Ptychography, CCD cameras and Image plates. New chapters are devoted entirely to scanning transmission electron microscopy and Z-contrast, and also to associated techniques, such as energy-loss spectrocospy, Alchemi, nanodiffraction and cathodoluminescence. Sources of software for image interpretation and electron-optical design are also given.

Transmission Electron MicroscopyTransmission Electron Microscopy



Kirkland, EJ 1998 Advanced Computing in Electron Microscopy Plenum Press New York. Required reading for the mathematically inclined microscopist. Jones, IP 1992 Chemical Microanalysis Using Electron Beams Institute of Materials London.

Author: David B. Williams

Publisher: Springer Science & Business Media

ISBN: 9780387765013

Category:

Page: 775

View: 101

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

Applications of Physical Methods to Inorganic and Bioinorganic ChemistryApplications of Physical Methods to Inorganic and Bioinorganic Chemistry



E.J. Kirkland, 'Advanced Computing in Electron Microscopy', Plenum, New York, 1998. This book contains a CD of software and source code. Multiple scattering calculations for STEM and TEM images, including phonon scattering.

Author: Robert A. Scott

Publisher: John Wiley & Sons

ISBN: 9781118625286

Category:

Page: 592

View: 886

Modern spectroscopic and instrumental techniques are essential tothe practice of inorganic and bioinorganic chemistry. This firstvolume in the new Wiley Encyclopedia of Inorganic ChemistryMethods and Applications Series provides a consistent andcomprehensive description of the practical applicability of a largenumber of techniques to modern problems in inorganic andbioinorganic chemistry. The outcome is a text that providesinvaluable guidance and advice for inorganic and bioinorganicchemists to select appropriate techniques, whilst acting as asource to the understanding of these methods. This volume is also available as part of Encyclopedia ofInorganic Chemistry, 5 Volume Set. This set combines all volumes published as EIC Books from 2007to 2010, representing areas of key developments in the field ofinorganic chemistry published in the Encyclopedia of InorganicChemistry. ahref="http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1119994284.html"Findout more/a.

Advanced Transmission Electron MicroscopyAdvanced Transmission Electron Microscopy



Proc Phys Soc 76:378 Crewe AV (1966) Scanning electron microscopes—is high resolution possible. Science 154: 729–738 Crewe AV, Wall J, ... Science 299:870–873 Kirkland EJ (2010) Advanced computing in electron microscopy, 2nd edn.

Author: Jian Min Zuo

Publisher: Springer

ISBN: 9781493966073

Category:

Page: 729

View: 160

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Transmission Electron MicroscopyTransmission Electron Microscopy



Cambridge University Press, Cambridge Kirkland EJ (2010) Advanced Computing in Electron Microscopy, 2nd edn. Springer, New York, Dordrecht, Heidelberg, London Pennycook SJ (2011) Scanning Transmission Electron Microscopy.

Author: C. Barry Carter

Publisher: Springer

ISBN: 9783319266510

Category:

Page: 518

View: 496

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Modeling Nanoscale Imaging in Electron MicroscopyModeling Nanoscale Imaging in Electron Microscopy



Haider M, Rose H et al (1998) A spherical-aberration-corrected 200 kV transmission electron microscope. Ultramicroscopy 75(l):53-60 Rose H (1990) Outline ... Pergamon, Oxford Kirkland EJ (1998) Advanced computing in electron microscopy.

Author: Thomas Vogt

Publisher: Springer Science & Business Media

ISBN: 9781461421900

Category:

Page: 182

View: 171

This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Transmission Electron MicroscopyTransmission Electron Microscopy



A 30, 280 (1974) P.A. Stadelmann: EMS – a software package for electron diffraction analysis and HREM image simulation in materials science. Ultramicroscopy 21, 131 (1987) E.J. Kirkland: Advanced Computing in Electron Microscopy (Plenum ...

Author: Ludwig Reimer

Publisher: Springer

ISBN: 9780387347585

Category:

Page: 590

View: 607

The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Electron Microscopy of PolymersElectron Microscopy of Polymers



As tomography is increasingly being used as a routine research technique in microscopy, it has become necessary to automate and streamline the entire process of -D ... Kirkland EJ ( ) Advanced computing in electron microscopy.

Author: Goerg H. Michler

Publisher: Springer Science & Business Media

ISBN: 9783540363521

Category:

Page: 473

View: 494

The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Aberration Corrected Analytical Transmission Electron MicroscopyAberration Corrected Analytical Transmission Electron Microscopy



Kirkland, E.J. (1998) Advanced Computing in Electron Microscopy, Plenum Press, New York. Koch, CT (2002) Determination Of Core Structure Periodicity And Point Defect Density Along Dislocations, PhD Thesis, Arizona State University.

Author: Rik Brydson

Publisher: John Wiley & Sons

ISBN: 9781119979906

Category:

Page: 296

View: 210

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Aberration Corrected Imaging in Transmission Electron MicroscopyAberration Corrected Imaging in Transmission Electron Microscopy



Advances in the environmental transmission electron microscope (ETEM) for nanoscale in situ studies of gas–solid interactions, Chemical Communications 50, pp. ... Advanced Computing in Electron Microscopy (Plenum Bibliography 391.

Author: Rolf Erni

Publisher: World Scientific Publishing Company

ISBN: 9781783265305

Category:

Page: 432

View: 652

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging. This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Scanning Transmission Electron MicroscopyScanning Transmission Electron Microscopy



45, 150–156 (2006) W.J. Huang, B. Jiang, R.S. Sun, J.M. Zuo, Towards sub-Å atomic resolution electron diffraction ... Nature 450, 702–704 (2007) E.J. Kirkland, Advanced Computing in Electron Microscopy (Plenum Press, New York, NY, ...

Author: Stephen J. Pennycook

Publisher: Springer Science & Business Media

ISBN: 9781441972002

Category:

Page: 762

View: 809

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Electron Microscopy and Analysis 2001Electron Microscopy and Analysis 2001



REFERENCES Crozier , P.A. , M. Catalano and R. Cingolani , 2002 ( submitted to Ultramicroscopy ) E.J. Kirkland , 1998 Advanced Computing in Electron Microscopy , Plenum Press , New York C. Mory , C. Colliex and J.M. Cowley ...

Author: M. Aindow

Publisher: CRC Press

ISBN: 0750308125

Category:

Page: 529

View: 427

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.

Scanning Transmission Electron Microscopy of NanomaterialsScanning Transmission Electron Microscopy of Nanomaterials



Hillyard, S. and Silcox, J. (1993), Ultramicroscopy, 52, 325. Josefsson, T.W. and Allen, L. J. (1994), Phys. Rev., 50, 6673. Kim, H.S. and Sheinin, S. S. (1982), Phys. Stat. Sol. (b), 109,807. Kirkland, E.J. (1998), Advanced Computing ...

Author: Nobuo Tanaka

Publisher: World Scientific

ISBN: 9781783264711

Category:

Page: 616

View: 610

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents:Introduction (N Tanaka)Historical Survey of the Development of STEM Instruments (N Tanaka)Basic Knowledge of STEM:Basics of STEM (N Tanaka and K Saitoh)Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)Theories of STEM Imaging:Theory for HAADF-STEM and Its Image Simulation (K Watanabe)Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)Advanced Methods in STEM:Aberration Correction in STEM (H Sawada)Secondary Electron Microscopy in STEM (H Inada and Y Zhu)Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)Electron Tomography in STEM (N Tanaka)Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)Recent Topics and Future Prospects in STEM (N Tanaka) Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. Key Features:Most advanced; befitting beginning graduate studentsVery convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application detailsSpans from the basic theory to the applications of STEMKeywords:STEM;Nanomaterials;HAADF-STEM;Atomic Resolution;Elemental Mapping;Dark Field Images;Nanoanalysis;Nanofabrication;NanodiffractionReviews: “This is written in a very readable style, packed with information and helpful explanations, and above all, very up to date. The book is generously illustrated, with many nice line-drawings, historic photographs, micrographs and spectra and, as a bonus, it has a name index as well as a subject index.” Ultramicroscopy

Science of MicroscopyScience of Microscopy



Advanced Computing in Electron Microscopy (Plenum, New York). Kirkland, E., Siegel, B., Uyeda, N. and Fujiyoshi, Y. (1985). Ultramicroscopy 17, 87–103. Kirkland, A., Saxton, O., Chau, K-L., Tsuno, K. and Kawasaki, M. (1995).

Author: P.W. Hawkes

Publisher: Springer Science & Business Media

ISBN: 9780387497624

Category:

Page: 1322

View: 403

This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.